Johnstech International is a leading provider of interconnect solutions for semiconductor manufacturers. The company's approach to semiconductor test and test interfaces has proven to be an important asset to manufacturers requiring higher first pass yields and lower cost of test in this rapidly changing industry.

Johnstech™ Array Series

Johnstech™ Pad Series

Johnstech™ Edge Series

Johnstech™ Leaded Series

Johnstech™ Array Series Yieldpro Array (LGA)
For LGA, CSP, and SOC Applications

Johnstech's YieldPro Array meets the needs of today's high performance test requirements. This product is an exceptional solution for LGA and SOC applications. The YieldPro Array technology, which was acquired from Agilent Technologies®, is elastomeric-based with a wiping action to break through solder oxides. The on-center design means that the footprint offers interchangeability** with spring pin technologies for those customers who require superior electrical and mechanical performance.

**Load board design evaluation required to determine interchangeability. Depending upon overall interface, numbers may vary. Specifications subject to change.

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Johnstech™ Array Series Yieldpro Array (BGA)
For BGA, CSP, and Array-Style Applications

Johnstech's Array Series high performance test contactors are designed to support high speed digital, high speed memory, and analog/mixed signal applications. These contactors are configurable to package size and I/O count, and include an elastomeric design for enhanced electrical and mechanical performance.

Contacting Methodology
The plunger mechanism provides a wipe action as it mates with the ball, penetrating any oxide layer. Each plunger floats in the X and Y direction, enabling the technology to accommodate balls that are not precisely positioned on the package and devices that are not presented coplanar. Also, each plunger moves vertically, independent of the others. The independent movement provides individual contact compliance.

YieldPro Array (BGA) Methodology
The elastomer provides a biasing force for vertical compliance; the "V" of the plunger provides a wipe action on the ball to penetrate solder oxides.

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Johnstech™ Pad Series
Test Solutions for High Frequency, High Power, and RF/Wireless Applications

Johnstech International's Pad Series high performance contactors and test sockets deliver flexibility, performance, and cost savings. The Pad Series products offer a wide variety of test solutions -- from an evaluation socket for validating a design in the early phases, to several mechanically robust products for characterization and production testing. All of the products have Johnstech's outstanding electrical performance in common and provide you with a proven solution from evaluation and bench top testing through final production.

Johnstech™ Pad KEL100 Series Production Contactor
For QFN, DFN, LCC, and Other Pad-Style Applications

The KEL100 Series is for both full and select Kelvin applications where production performance results are as critical as the Kelvin requirements themselves. This product is an exceptional solution for applications where greater ability to control voltage levels is required for higher confidence in device yields and better grading control. The same benefits with Johnstech's frame-slider technology exist with the KEL100 Series -- a robust production solution with a wiping action to break through solder oxides and excellent field maintainability.

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Johnstech™ Pad ROL200 Series Production Contactor
For QFN, DFN, LCC, and Other Pad-Styles

The ROL200 Pad Series products uses a new patented "rolling" contact technology to improve production performance. This product is an exceptional solution for applications where consistent, reliable, repeatable results are required in high volume production environments, and where load board pad life must be maximized, thereby reducing overall cost of test. The ROL200 Series contactors provide the same excellent electrical and mechanical performance with field maintainability that you are used to from Johnstech's production contactors.

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Johnstech™ Pad ROL100 Series Production Contactor
For QFN, DFN, and Other Pad-Style Applications

Johnstech International's Pad ROL100 Series contactor delivers 40GHz of bandwidth, less than 0.05nH of ground inductance, and the production worthy performance required for high frequency RF/Wireless and High Speed Digital applications. With its short signal transmission path, a short inductance path to ground, and a short heat transfer path, the Pad ROL100 Series is well suited to minimize signal distortion in device testing. The new "rolling" contact design with a smooth finish, along with a new housing design, improves MTBA and minimizes the effects of the contact on the load board pads, maximizing load board pad life. Providing 100% correlation between lab characterization to production test, the Pad ROL100 Series is the superior electrical and mechanical contactor of choice.

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Johnstech™ Edge Series
Test Solutions for SDRAM, DDR, Rambus Memory, and other PCB Edge Card Applications

Johnstech International's Short Contact® technology is now available for DIMM, RIMM, and SIMM devices. The Johnstech Edge Series high performance test contactor provides superior electrical performance and mechanical life. The solderless surface mount design eliminates the need for socket savers and enhances electrical performance. Easy insertion and removal is key in manual and automated testing of memory modules and other card devices.

In addition to custom configurations, Johnstech has standard product offerings for Card and Edge test solutions:

> SDRAM - 168 pin, 1.27 pitch - JEDEC MO-161 modules

> Workstations - 200 pin, 1.27 pitch - JEDEC MO-172 modules

> Small Outlines - 0.8 pitch - JEDEC MO-190 SO DIMMS

> Rambus - 168 and 184 pin, 1.0 pitch - RIMM and S-RIMM

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Johnstech™ Leaded Series
Johnstech's flagship Leaded Series high performance contactors were the first in the industry to address the needs of high performance test. Today, they are still a workhorse for leaded device testing in both automated and characterization test. Johnstech's Leaded Series high performance test contactors are designed to support high frequency device under test contacting of parts in leaded packaging for RF, Analog/Mixed Signal, High Speed Digital, and High Speed Memory applications. These contactors are configurable to package size and I/O count, and include an elastomeric design for enhanced electrical and mechanical performance.

Superior Electrical Performance
The small profile of the contact provides superior electrical performance, including low inductance, reduced contact capacitance, and close decoupling, critical elements in high speed, high frequency test.

Configuration
Johnstech's short contact length and short electrical path contribute to overall performance improvements through close decoupling and improved electrical integrity.

Contacting Technology
The short, rigid contact design lends itself to superior electrical and mechanical performance.

Housing Sizes
The Leaded Series contactors offer several options for housing sizes, based on application and handler interfaces.

Some examples of housing sizes include:

> Mini 1.5in x 1.5in

> Standard 2.5in x 2.9in

> Narrow Body 2.2in x 2.9in

> Extended 3.25in x 3.25in

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