Aseco offers their semiconductor customers automated
manufacturing solutions that will exceed their expectations.
Aseco designs manufacturers and markets a
wide range of wafer inspection and handling systems.
S-130
High Performance
Convertible SMD Test Handler
- Graphical
CRT status display
- Menu
based user interface
- Devices
are delicately cycled on air bearing surfaces
- Built
in diagnostics and performance reporting.
- More
than 175 conversion kits available.
- Conductive,
grounded device path for ESD protection
- Many
contractor options available including
standard, high performance, Kelivin, 00
ohm nanohex, and third party contactors.
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S-170
Convertible SOIC Test Handler
- Tri
temperature (-55°C to+150°C operation)
- High
throughput
- Low
jam rate
- CRT
operator display
- User
friendly menu driven operation
- Optional
RS-232 and IEEE interfaces
- Conductive,
grounded device path for ESD protection
- Small
footprint
- Many
contactor options
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S
- 200 Test Handler
- High
throughput
- Low
jam rate
- Streamlined
production allowing test and inspection
of devices in a single operation
- Optional
tray changer modules for input and output
- Conversion
kits available.
- 3D
lead inspection
- Choice
of tri temperature
- Operation
interface via touch screen colour display
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Aseco
also have two versions of the S-130 for testing
accelerometer sensors- the S-133 for axis types
and the S-130 for gyro radial.