Memory Test Solutions

Acuid offers memory test and handling solutions that increase module and chip throughput and yield.

Acuid’s new generation of low-cost, memory module testers have been designed to reduce the cost of memory testing and improve the quality of test. The flexible, high-speed bench-top systems feature fault strobe positioning technology to improve performance.

A complete line of high-speed, high specification memory testers for testing SDRAM/PC133 and DDR SDRAM/PC2700 modules and packaged devices. For example the bT Series Memory Testers offers the following benefits:

• Test frequencies up to 333MHz with ±200ps total timing accuracy.
• Integrated handlers to handle different throughput rates
• Auto-calibration to ensure testing is always within specification.
• Full operating system software for module and packaged part test is standard together with optional software for test engineering and production optimisation.